MSIA Technical Series #5

MSIA, in collaboration with Innovave Tech , is pleased to invite you to an upcoming webinar on:

AI-Driven Total Quality Management in Semiconductor Manufacturing

As semiconductor manufacturing advances with increasing complexity, traditional quality management approaches are no longer sufficient. This session explores how AI is transforming Total Quality Management (TQM) into a predictive, adaptive, and continuously learning system across the semiconductor fab.

This session will cover:
1. Rethinking TQM: From rule-based and reactive to predictive and proactive quality systems
2. Key AI technologies in TQM:
* Machine Learning (yield prediction, anomaly detection, tool health)
* Computer Vision (wafer inspection, defect detection & classification)
* Agentic / Decision AI (root cause analysis, process optimisation)
3. Real-world applications:
* Automated defect classification (reducing manual review by up to 80–95%)
* Yield and excursion prediction for early intervention
* AI-assisted root cause analysis (weeks → days resolution time)

Speakers

Xu Jinsong, Founder & CEO, Innovave (Singapore)
Meredy Mun, Regional BDM, Innovave


Date: 10 April 2026 (Friday)
Time: 3:00 PM – 4:30 PM
Platform: Online Webinar

Registration deadline: 8 April 2026

Register here:
Scan the QR code on the poster or sign up via the link below.
https://docs.google.com/forms/d/e/1FAIpQLScRx8h2I3eoeiHvCecoUvArh4I8SIx6f9A4HsWZa4rJRfuOTg/viewform?usp=send_form

The webinar access link will be shared upon successful registration.

We look forward to your participation!